An odd-even model for diagnosis of shorts on NoC interconnects

Interconnect shorts in a network-on-chip (NoC) have caused data overloading and misrouting that make an extra burden on performance metrics. Therefore, diagnosis of shorts on NoC interconnects has taken special interest. Existing works on diagnosis of shorts on NoC interconnects have two major issues-high test time and less scalability. This paper presents a distributed packet address driven test strategy that addresses shorts on NoC interconnects and tackles these issues. High test time is reduced significantly by lowering the test rounds. The scalability is established by applying proposed test strategy on different NoCs. Simulations achieve 100% test and fault coverages, and demonstrate impact of interconnect shorts for a subset of performance metrics in actual traffic in the network.