Micro data handling for semiconductor devices using high resolution ADC

In VLSI technology devices fabricated using semiconductor materials like Si, GaAs have been scaled down to nm range. For these devices there is a need to monitor the voltage in μV range. The proposed work presents a solution to measure such low voltages in the form of an embedded device. This device includes the facility of real time data logging and plotting the characteristics on graphical LCD. This will help to understand the characteristics of nm range devices. Hence, a major goal of this work is nm sensors and devices testing. To achieve this, proposed work uses the Resistive method. This method is linear and accurate for measuring current. We can then determine the voltage by applying Ohms law. The device is built around the PIC 30F4011. This processor consists of 30MIPS high speed DSP engine. Design also contains very high precise 24 bit (Σ-Δ) ADC ADuCM360 with very good conversion speed. The facility of memory card is provided for data storage.