• DocumentCode
    376655
  • Title

    First observation of optical second-order nonlinearity of poled pure TeO/sub 2/ glass film prepared by novel fabrication process

  • Author

    Taniguchi, T. ; Tanaka, H. ; Nishimura, K. ; Usami, M.

  • Author_Institution
    KDD R&D Labs. Inc., Saitama, Japan
  • Volume
    2
  • fYear
    2001
  • fDate
    15-19 July 2001
  • Abstract
    We have succeeded in observation of the optical second-order nonlinearity of a pure tellurite glass film, which was synthesized by a simple sputtering method and was electrothermally poled with a unique sample structure, for the first time.
  • Keywords
    dielectric polarisation; nonlinear optical susceptibility; optical films; optical glass; sputter deposition; sputtered coatings; tellurium compounds; EPMA; TeO/sub 2/; X-ray diffraction; electrothermally poled; high electric field; optical second-order nonlinearity; poled pure tellurite glass film; scanning electron microscopy; second-order susceptibility; sputtered film; synthesis technique; Anodes; Crystallization; Glass; Nonlinear optics; Optical buffering; Optical films; Sputtering; Substrates; Tellurium; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2001. CLEO/Pacific Rim 2001. The 4th Pacific Rim Conference on
  • Conference_Location
    Chiba, Japan
  • Print_ISBN
    0-7803-6738-3
  • Type

    conf

  • DOI
    10.1109/CLEOPR.2001.971032
  • Filename
    971032