Title :
Analysis of equilateral triangle semiconductor microlasers with rough sidewalls
Author :
Yong-Zhen Huang ; Wei-Hua Guo ; Li-Juan Yu ; Hong-Bing Lei
Author_Institution :
Inst. of Semicond., Acad. Sinica, Beijing, China
Abstract :
The mode frequencies and quality factors are calculated for the equilateral triangle semiconductor microlasers with sinusoidal and random Gaussian sidewalls. The results show that the modes can still have high Q-factors.
Keywords :
Q-factor; finite difference time-domain analysis; laser modes; microcavity lasers; rough surfaces; semiconductor lasers; Pade approximation; equilateral triangle resonator; equilateral triangle semiconductor microlasers; finite-difference time-domain technique; mode frequencies; mode quality factors; random Gaussian sidewalls; rough sidewalls; sinusoidal sidewalls; Dry etching; Finite difference methods; Fluctuations; Frequency; Integrated optoelectronics; Laboratories; Optical reflection; Q factor; Solids; Time domain analysis;
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO/Pacific Rim 2001. The 4th Pacific Rim Conference on
Conference_Location :
Chiba, Japan
Print_ISBN :
0-7803-6738-3
DOI :
10.1109/CLEOPR.2001.971108
