• DocumentCode
    3767993
  • Title

    Fabrication and measurements of Nb/Al-AlOx/Nb tunnel junctions and DC SQUID

  • Author

    Wei Xiong;Li Liang Ying;Hai Wang;Guo Feng Zhang;Zhen Wang

  • Author_Institution
    Shanghai Institute of Microsystem and Information Technology (SIMIT) Chinese Academy of Sciences (CAS) Shanghai 200031, China
  • fYear
    2015
  • Firstpage
    282
  • Lastpage
    283
  • Abstract
    Several different critical current density (Jc:30A/cm2~4000A/cm2) of Nb/Al-AlOx/Nb Josephson junctions were fabricated by standard selective niobium etch process (SNEP) for application of dc SQUID magnetometers. The subgap leakage factor Vm of most junctions is larger than 30 mV. Based on the good tunneling properties of junctions, we designed and fabricated a dc SQUID with loop inductance of 140 pH and a pickup coil of 8.9 mm × 8.9 mm by setting the Stewart-McCumber parameter βc and the screening parameter βL as about 1. Each of two Nb/Al-AlOx/Nb junction with dimensions of 4μm × 4μm and a critical current density of Jc≈50A/cm2, was shunted by a 8.4 Ω Molybdenum resistance. The white field noise was measured to be less than 5 fTHz-1/2.
  • Keywords
    "Junctions","SQUIDs","Fabrication","Niobium","Films","Josephson junctions","Magnetic field measurement"
  • Publisher
    ieee
  • Conference_Titel
    Applied Superconductivity and Electromagnetic Devices (ASEMD), 2015 IEEE International Conference on
  • Print_ISBN
    978-1-4673-8106-2
  • Type

    conf

  • DOI
    10.1109/ASEMD.2015.7453574
  • Filename
    7453574