DocumentCode
3767993
Title
Fabrication and measurements of Nb/Al-AlOx/Nb tunnel junctions and DC SQUID
Author
Wei Xiong;Li Liang Ying;Hai Wang;Guo Feng Zhang;Zhen Wang
Author_Institution
Shanghai Institute of Microsystem and Information Technology (SIMIT) Chinese Academy of Sciences (CAS) Shanghai 200031, China
fYear
2015
Firstpage
282
Lastpage
283
Abstract
Several different critical current density (Jc:30A/cm2~4000A/cm2) of Nb/Al-AlOx/Nb Josephson junctions were fabricated by standard selective niobium etch process (SNEP) for application of dc SQUID magnetometers. The subgap leakage factor Vm of most junctions is larger than 30 mV. Based on the good tunneling properties of junctions, we designed and fabricated a dc SQUID with loop inductance of 140 pH and a pickup coil of 8.9 mm × 8.9 mm by setting the Stewart-McCumber parameter βc and the screening parameter βL as about 1. Each of two Nb/Al-AlOx/Nb junction with dimensions of 4μm × 4μm and a critical current density of Jc≈50A/cm2, was shunted by a 8.4 Ω Molybdenum resistance. The white field noise was measured to be less than 5 fTHz-1/2.
Keywords
"Junctions","SQUIDs","Fabrication","Niobium","Films","Josephson junctions","Magnetic field measurement"
Publisher
ieee
Conference_Titel
Applied Superconductivity and Electromagnetic Devices (ASEMD), 2015 IEEE International Conference on
Print_ISBN
978-1-4673-8106-2
Type
conf
DOI
10.1109/ASEMD.2015.7453574
Filename
7453574
Link To Document