• DocumentCode
    3768453
  • Title

    Device architecture for terahertz characterization of organic electro-optic ultra-thin films using time-domain attenuated total reflection method

  • Author

    Wenwei Jin; Ruimin Xu

  • Author_Institution
    EHF Key Laboratory of Fundamental Science, University of Electronic Science and Technology of China, Chengdu 611731, China
  • fYear
    2015
  • Firstpage
    563
  • Lastpage
    564
  • Abstract
    We developed a new device architecture for characterizing the properties of electro-optic (EO) material from the thin-film device utilizing time-domain attenuated total reflection spectroscopy in the terahertz (THz) frequency region. The properties of the test material showed good agreement with the results from pellets measurements by conventional THz-TDS system.
  • Keywords
    "Optical films","Optical reflection","Optical pulses","Instruments","Polymers"
  • Publisher
    ieee
  • Conference_Titel
    Communication Problem-Solving (ICCP), 2015 IEEE International Conference on
  • Print_ISBN
    978-1-4673-6543-7
  • Type

    conf

  • DOI
    10.1109/ICCPS.2015.7454230
  • Filename
    7454230
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3768453