Title :
Measurement uncertainties in filter and low-loss measurements
Author_Institution :
Agilent Technol., USA
Abstract :
The author of this paper extends the understanding of measurement uncertainty by introducing new terms to the standard error models, and provides practical understanding to the importance of error sources and DUT characteristics in interpreting the quality of real-world measurements.
Keywords :
measurement errors; measurement uncertainty; microwave filters; microwave measurement; DUT characteristics; error sources; filter measurements; low-loss measurements; measurement uncertainty; real-world measurements; standard error models; Calibration; Filters; Frequency measurement; Instruments; Loss measurement; Manufacturing; Measurement standards; Measurement uncertainty; Narrowband; Particle measurements;
Conference_Titel :
Microwave Conference, 2001. APMC 2001. 2001 Asia-Pacific
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-7138-0
DOI :
10.1109/APMC.2001.985517
