Chracerization of mixed target scattering uisng random similarity

A random similarity parameter is proposed which can measure not only the scattering similarity of any two scatterers but also the scattering randomness. The parameter covers both the similarity parameters developed by Yang et al. and Chen et al., and provides a fast and competent alternative to the scattering entropy H parameter. The excellence of the parameter on target discrimination is demonstrated by simply applying it to the terrain classification.