DocumentCode :
3769705
Title :
The dielectric strength of epoxy embedding compounds
Author :
C. C. Scheid
Author_Institution :
General Electric Company
fYear :
1962
Firstpage :
167
Lastpage :
169
Abstract :
Miniaturization has become a prime design goal especially for airborne electronic components. Generally, this means increased electrical stresses which require both redesign of the insulation system and the introduction of improved materials. To meet these dielectric strength requirements, there has been increased reliance on epoxy embedding compounds. As in the case of any relatively new insulation concept, there is a tremendous need for additional design data. This is especially true in the case of dielectric strength since much of the available data is difficult to relate to a completely solid insulation system.
Keywords :
"Electrodes","Dielectric breakdown","Wires","Epoxy resins","Insulation"
Publisher :
ieee
Conference_Titel :
Electrical Insulation Conference Materials and Application, 1962. EIC 1962. EI
Print_ISBN :
978-1-5090-3103-0
Type :
conf
DOI :
10.1109/EIC.1962.7456074
Filename :
7456074
Link To Document :
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