Title :
A high stability silicon/silicon-dioxide capacitor
Author :
O. J. Wied;R. W. Young
Author_Institution :
Sprague Electric Co., North Adams, Mass
Abstract :
Investigations originally stimulated by an interest in the passivation of silicon surfaces have culminated in a high stability capacitor with a silicon-dioxide thin film as the dielectric. This paper presents some characteristics of the silicon-dioxide thin film alone, and of a silicon/silicon-dioxide capacitor. The capacitor can exhibit either a highly stable capacitance or a capacitance which is frequency and bias-variant, depending on the resistivity and conductivity type of silicon used.
Keywords :
"Films","Silicon","Capacitors","Capacitance","Substrates","Humidity","Conductivity"
Conference_Titel :
Electrical Insulation Conference Materials and Application, 1962. EIC 1962. EI
Print_ISBN :
978-1-5090-3103-0
DOI :
10.1109/EIC.1962.7456077