• DocumentCode
    3769787
  • Title

    Study and reduction of variability in 28 nm FDSOI technology

  • Author

    Gilles Jacquemod;Zhaopeng Wei;Jad Modad;Yves Leduc;Philippe Lorenzini;Frederic Hameau;Emeric De Foucauld

  • Author_Institution
    Nice Sophia Antipolis University, EpOC, URE UNS 006, Biot, France
  • fYear
    2015
  • Firstpage
    19
  • Lastpage
    22
  • Abstract
    This In this paper, we present a new inverter topology in order to decrease the process variability influence on performances of a ring oscillator. Using FDSOI technology, we used the back-gate electrode of the transistor to symmetrize the output of a complementary inverter. This technique will reduce the variability of the inverter and the jitter (i.e. the phase noise) of the ring oscillator. Complementary cells allow us to implement back-gate auto-biasing feedback without adding transistors and to realize a quadrature ring oscillator with an even number of inverters.
  • Keywords
    "Inverters","Topology","Ring oscillators","Transistors","Standards","CMOS integrated circuits","Logic gates"
  • Publisher
    ieee
  • Conference_Titel
    CMOS Variability (VARI), 2015 International Workshop on
  • Type

    conf

  • DOI
    10.1109/VARI.2015.7456557
  • Filename
    7456557