DocumentCode :
3770152
Title :
Three-dimensional ovonic threshold switching model with combination of in-band and trap-to-band hopping mechanism for chalcogenide-based phase-change memory
Author :
Chong Chen;Yiqun Wei;Jianwei Zhao;Xinnan Lin;Zhitang Song
Author_Institution :
The Key Laboratory of Integrated Microsystems, ECE, Peking University Shenzhen Graduate School, Shenzhen, P.R. China
fYear :
2015
Firstpage :
1
Lastpage :
3
Abstract :
The snapback effect of amorphous chalcogenide materials has attracted a wide attention. But the mechanism of ovonic threshold switching is still controversial. And two-dimensional model can´t simulate device with complicated boundaries. In this paper we developed a three-dimensional numerical model based on trap to band and in-band transition. The simulation results are compared with experimental data.
Keywords :
"Electron traps","Solid modeling","Conductivity","Switches","Threshold voltage","Phase change materials","Mathematical model"
Publisher :
ieee
Conference_Titel :
Non-Volatile Memory Technology Symposium (NVMTS), 2015 15th
Type :
conf
DOI :
10.1109/NVMTS.2015.7457430
Filename :
7457430
Link To Document :
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