• DocumentCode
    3770167
  • Title

    Origin of high data retention for Ge1Cu2Te3 phase-change memory

  • Author

    Nian-Ke Chen;Xue-Peng Wang;Xian-Bin Li

  • Author_Institution
    State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    To meet the high-temperature applications of the phase change memory, Ge1Cu2Te3 (GCT) has been proposed to be a suitable candidate due to its good amorphous stability. Here, we investigate the basic atomic bonding mechanism by first-principles calculations to understand this. The amorphous GCT has significant chemical disorder with large amounts of homopolar bonds. Cage-like clusters (composed of 3-fold rings) are mainly related to Cu atoms. The bonding mechanism in crystalline GCT is proposed and demonstrated by the nonequivalent sp3 hybridization with Te lone-pair electrons. In contrast, amorphous GCT requires Cu d electrons to participate in bonding due to the isolation of Te lone-pair electrons. Thus, the vast difference in atomic and electronic structures between the amorphous and crystalline phase makes the good amorphous stability for high data retention.
  • Keywords
    "Bonding","Thermal stability","Phase change materials","Phase change memory","Crystals","Metals","Chemicals"
  • Publisher
    ieee
  • Conference_Titel
    Non-Volatile Memory Technology Symposium (NVMTS), 2015 15th
  • Type

    conf

  • DOI
    10.1109/NVMTS.2015.7457485
  • Filename
    7457485