DocumentCode
3770167
Title
Origin of high data retention for Ge1Cu2Te3 phase-change memory
Author
Nian-Ke Chen;Xue-Peng Wang;Xian-Bin Li
Author_Institution
State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
fYear
2015
Firstpage
1
Lastpage
4
Abstract
To meet the high-temperature applications of the phase change memory, Ge1Cu2Te3 (GCT) has been proposed to be a suitable candidate due to its good amorphous stability. Here, we investigate the basic atomic bonding mechanism by first-principles calculations to understand this. The amorphous GCT has significant chemical disorder with large amounts of homopolar bonds. Cage-like clusters (composed of 3-fold rings) are mainly related to Cu atoms. The bonding mechanism in crystalline GCT is proposed and demonstrated by the nonequivalent sp3 hybridization with Te lone-pair electrons. In contrast, amorphous GCT requires Cu d electrons to participate in bonding due to the isolation of Te lone-pair electrons. Thus, the vast difference in atomic and electronic structures between the amorphous and crystalline phase makes the good amorphous stability for high data retention.
Keywords
"Bonding","Thermal stability","Phase change materials","Phase change memory","Crystals","Metals","Chemicals"
Publisher
ieee
Conference_Titel
Non-Volatile Memory Technology Symposium (NVMTS), 2015 15th
Type
conf
DOI
10.1109/NVMTS.2015.7457485
Filename
7457485
Link To Document