• DocumentCode
    3770931
  • Title

    Characterization of body effect of Au-EGFET for KRAS gene detection

  • Author

    Hui-Hsin Chang; Yi-Ting Lin; Chai-Ming Yang; Ji-dung Luo; Chiuan-Chian Chiou; Chao-Sung Lai

  • Author_Institution
    Department of Electronic Engineering, Chang Gung University, Taoyuan, Taiwan
  • fYear
    2014
  • fDate
    7/1/2014 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The sensing properties of Au-EGFET with body effect for DNA detection were first investigated in this study. The body effect means different substrate bias in CMOS circuit operation without common ground. With positive VBS of 1V, more shift of ID-VG curve could be a good index of DNA hybridization and concentration. It could be explained be the electric field induced counter ion effect. This measured technique can be used to enhance the sensing signal and improve the limit of detection (LOD).
  • Keywords
    "Substrates","DNA","Gold","Charge measurement","Ions","Probes","Nitrogen"
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2014 IEEE International
  • Electronic_ISBN
    2159-3531
  • Type

    conf

  • DOI
    10.1109/INEC.2014.7460457
  • Filename
    7460457
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3770931