DocumentCode :
3770985
Title :
Optical characterisation of a strained-silicon cold-electron bolometer at 160 GHz
Author :
T. L. R. Brien;P. A. R. Ade;P. S. Barry;C. J. Dunscombe;D. R. Leadley;D. V. Morozov;M. Myronov;E. H. C. Parked;M. J. Prest;M. Prunnila;R. V. Sudiwala;T. E. Whall;P. D. Mauskopf
Author_Institution :
School of Physics and Astronomy, Cardiff University, The Parade, Cardiff, CF24 3AA, UK
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
We present a study of a cold-electron bolometer operating at 350 mK with a twin-slot antenna coupling radiation at 160 GHz. The detector´s absorbing element consists of degenerately-doped strained silicon and has Schottky contacts to superconducting aluminium leads. These contacts allow for direct electron cooling of the absorber to below the phonon temperature, enabling the cold-electron bolometer to achieve much faster time constants (τ <; 1 μs) compared to conventional bolometric detectors while not sacrificing sensitivity. We measure both the dark and optically-loaded noise of the detector via a novel method of cross-correlating the outputs of two amplifiers in order to measure noise below the amplifier noise level. From this we measure the photon-noise limited noise-equivalent power of the detector to be 6.6 × 10-17 W Hz-1/2 when observing a 77-Kelvin source.
Keywords :
"Detectors","Silicon","Optical variables measurement","Optical detectors","Tunneling","Bolometers","Optical device fabrication"
Publisher :
ieee
Conference_Titel :
Millimeter Waves and THz Technology Workshop (UCMMT), 2015 8th UK, Europe, China
Type :
conf
DOI :
10.1109/UCMMT.2015.7460630
Filename :
7460630
Link To Document :
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