DocumentCode
3771055
Title
Lifetime and factors affecting electrical degradation of solid dielectrics
Author
W. R. Bell;M. J. Mulcahy
Author_Institution
Ion Physics Corporation, Burlington, Massachusetts 01803, USA
fYear
1971
Firstpage
188
Lastpage
190
Abstract
The intrinsic electric strength of many insulating solids appears to be in excess of 10 MV/cm. Values in this region have been measured on thin carefully prepared samples with pulsed voltages. In practical applications, however, design stresses well below this value are used mainly, because of reliability requirements, since volume breakdown may be caused by anyone of a number of factors, at stress values which are only a fraction of the intrinsic electric strength of the material. These factors include thermal instability, electrochemical and electromechanical processes, chemical or thermal deterioration and partial discharge erosion or channel propagation, which latter has probably most influence on the lifetime of dielectrics.
Keywords
"Solids","Insulation","Stress","Electric breakdown","Electrodes","Resistance","Casting"
Publisher
ieee
Conference_Titel
Electrical Insulation Conference, 1971 EIC 10th
Print_ISBN
978-1-5090-3116-0
Type
conf
DOI
10.1109/EIC.1971.7460810
Filename
7460810
Link To Document