DocumentCode :
3771196
Title :
Performance of fillers at microwave frequencies
Author :
Irwin J. Steinhardt;Paul Vadopalas;Hyman Plutchok
Author_Institution :
Sylvania Electronic Systems-West, USA
fYear :
1965
Firstpage :
3
Lastpage :
6
Abstract :
At the Sylvania Electronic Systems?West facility in Mountain View, California, considerable interest has been generated in the fabrication of lightweight electronic devices for use in a wide variety of electronic systems in the microwave frequency spectrum. Such devices would be useful applied to systems where space and weight are primary considerations and where the dielectric losses incurred by their use can be tolerated. The dielectric materials to be used would have controlled dielectric constants higher than those conventionally encountered.
Keywords :
"Plastics","Resins","Microwave devices","Loss measurement","Glass","Titanium"
Publisher :
ieee
Conference_Titel :
Electrical Insulation Conference, 1965 Sixth
Print_ISBN :
978-1-5090-3105-4
Type :
conf
DOI :
10.1109/EIC.1965.7461161
Filename :
7461161
Link To Document :
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