DocumentCode :
3771275
Title :
Session on the measurement of dielectric properties at elevated temperatures, introduction
Author :
Kenneth H. Wechsler
Author_Institution :
Westinghouse Electric Corporation, Hampton, S. C. 29924, USA
fYear :
1965
Firstpage :
250
Lastpage :
252
Abstract :
This session is concerned with the measurement of dielectric properties of electrical insulation at temperatures which are elevated above the normal room ambient temperature. The three papers which follow will discuss techniques utilized to measure specific properties. We shall now define the properties, discuss the reason why it is desirable to perform measurement at elevated temperature, review the activities of the American Society for Testing and Materials (ASTM) in this field, and examine the need for this session.
Keywords :
"Temperature measurement","Temperature","Dielectric measurement","Immune system","Dielectric breakdown","Dielectric constant"
Publisher :
ieee
Conference_Titel :
Electrical Insulation Conference, 1965 Sixth
Print_ISBN :
978-1-5090-3105-4
Type :
conf
DOI :
10.1109/EIC.1965.7461240
Filename :
7461240
Link To Document :
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