DocumentCode
3771275
Title
Session on the measurement of dielectric properties at elevated temperatures, introduction
Author
Kenneth H. Wechsler
Author_Institution
Westinghouse Electric Corporation, Hampton, S. C. 29924, USA
fYear
1965
Firstpage
250
Lastpage
252
Abstract
This session is concerned with the measurement of dielectric properties of electrical insulation at temperatures which are elevated above the normal room ambient temperature. The three papers which follow will discuss techniques utilized to measure specific properties. We shall now define the properties, discuss the reason why it is desirable to perform measurement at elevated temperature, review the activities of the American Society for Testing and Materials (ASTM) in this field, and examine the need for this session.
Keywords
"Temperature measurement","Temperature","Dielectric measurement","Immune system","Dielectric breakdown","Dielectric constant"
Publisher
ieee
Conference_Titel
Electrical Insulation Conference, 1965 Sixth
Print_ISBN
978-1-5090-3105-4
Type
conf
DOI
10.1109/EIC.1965.7461240
Filename
7461240
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