• DocumentCode
    3771275
  • Title

    Session on the measurement of dielectric properties at elevated temperatures, introduction

  • Author

    Kenneth H. Wechsler

  • Author_Institution
    Westinghouse Electric Corporation, Hampton, S. C. 29924, USA
  • fYear
    1965
  • Firstpage
    250
  • Lastpage
    252
  • Abstract
    This session is concerned with the measurement of dielectric properties of electrical insulation at temperatures which are elevated above the normal room ambient temperature. The three papers which follow will discuss techniques utilized to measure specific properties. We shall now define the properties, discuss the reason why it is desirable to perform measurement at elevated temperature, review the activities of the American Society for Testing and Materials (ASTM) in this field, and examine the need for this session.
  • Keywords
    "Temperature measurement","Temperature","Dielectric measurement","Immune system","Dielectric breakdown","Dielectric constant"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation Conference, 1965 Sixth
  • Print_ISBN
    978-1-5090-3105-4
  • Type

    conf

  • DOI
    10.1109/EIC.1965.7461240
  • Filename
    7461240