DocumentCode
377132
Title
Study of technology migration on 2nd generation current conveyors performance
Author
Iskander, R. ; Kayed, S. ; Ragaie, H.F.
Author_Institution
Mentor Graphics Corp., Cairo, Egypt
Volume
1
fYear
2001
fDate
2001
Firstpage
286
Abstract
We have studied the technology migration effect on a CCII+ cell using a methodology that can be generalized for migrating analog cells between two technologies. The migration is based on optimization. The cell is migrated downward from 1.2μ to 0.5μ CMOS process technology. The cell performance is reevaluated
Keywords
CMOS analogue integrated circuits; circuit optimisation; current conveyors; integrated circuit technology; 1.2 to 0.5 micron; CMOS process technology; analog cell; optimization; second generation current conveyor; technology migration; CMOS process; CMOS technology; Constraint optimization; Electronic design automation and methodology; Graphics; Impedance; Kirchhoff´s Law; Logic; Nuclear power generation; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2001. MWSCAS 2001. Proceedings of the 44th IEEE 2001 Midwest Symposium on
Conference_Location
Dayton, OH
Print_ISBN
0-7803-7150-X
Type
conf
DOI
10.1109/MWSCAS.2001.986169
Filename
986169
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