Nondestructive measurements for determining the adequacy of a dielectric

In order to determine the adequacy of a dielectric, a testing program must be devised that covers the three areas of possible dielectric deficiencies. These modes of dielectric failure may be reviewed briefly as follows: The intrinsic strength of a solid dielectric is that which relates to its atomic structure. The breakdown mechanism of this mode takes place when the applied electric field is strong enough that a considerable number of the initial free electrons in the conduction band and in the localized donor levels acquire energies greater than the X-ray absorption limit. These electrons are then likely to expel electrons from the valence band. The electrons so freed have similar chance of abstracting sufficient energy from the field for further ionization.