Title :
Capacitor film surface assessment studies
Author :
I. Galperin;W. White
Author_Institution :
Maxwell Laboratories, Inc., 8835 Balboa Avenue, San Diego, CA 92123
Abstract :
Three prominent biaxially oriented capacitor films were investigated for surface defects and thickness variation. Breakdown voltages of the film were determined and explained in terms of probable causes. An inverse relationship of breakdown voltage and dielectric constant was found.
Keywords :
"Films","Capacitors","Polymers","Surface treatment","Dielectric constant","Rough surfaces","Surface roughness"
Conference_Titel :
Electrical/Electronical Insulation Conference, 1983 EIC 6th
Print_ISBN :
978-1-5090-3114-6
DOI :
10.1109/EEIC.1983.7465082
