• DocumentCode
    3772642
  • Title

    Capacitor film surface assessment studies

  • Author

    I. Galperin;W. White

  • Author_Institution
    Maxwell Laboratories, Inc., 8835 Balboa Avenue, San Diego, CA 92123
  • fYear
    1983
  • Firstpage
    275
  • Lastpage
    278
  • Abstract
    Three prominent biaxially oriented capacitor films were investigated for surface defects and thickness variation. Breakdown voltages of the film were determined and explained in terms of probable causes. An inverse relationship of breakdown voltage and dielectric constant was found.
  • Keywords
    "Films","Capacitors","Polymers","Surface treatment","Dielectric constant","Rough surfaces","Surface roughness"
  • Publisher
    ieee
  • Conference_Titel
    Electrical/Electronical Insulation Conference, 1983 EIC 6th
  • Print_ISBN
    978-1-5090-3114-6
  • Type

    conf

  • DOI
    10.1109/EEIC.1983.7465082
  • Filename
    7465082
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3772642