• DocumentCode
    377275
  • Title

    Investigation of voltage breakdown caused by microparticles

  • Author

    Werner, G.R. ; Betzwieser, J.C. ; Knobloch, J. ; Padamsee, H. ; Qureshi, M. ; Shipman, J.E. ; McKeown, P.J.

  • Author_Institution
    Lab. of Nucl. Studies, Cornell Univ., Ithaca, NY, USA
  • Volume
    2
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1071
  • Abstract
    Degradation of RF accelerating cavities caused by field emission currently limits the design of future linear accelerators. When field emission is the problem, foreign particles often deserve the blame, but they can be "processed" away if the cavity electric field is high enough to initiate voltage breakdown near the particle site, in which case the troublesome particle vaporizes, leaving behind a crater surrounded by a starburst-shaped feature. Severe cratering, however, erodes cavity surfaces to the point of significantly diminished acceleration capability. Breakdown events producing craters and starbursts. similar to those seen in RF cavities can also be incited by a DC electric field. After intentionally contaminating niobium and copper cathodes with different kinds of micron-sized particles, we used scanning electron microscopes with EDX and AES capabilities to obtain "before" and "after" pictures of particles that vaporized under DC electric fields between 30 and 150 MV/m
  • Keywords
    accelerator cavities; linear accelerators; niobium; vacuum breakdown; DC electric fields; RF accelerating cavities; cavity electric field; field emission; foreign particles; linear accelerators; micron-sized particles; severe cratering; starburst-shaped feature; voltage breakdown; Acceleration; Cathodes; Copper; Degradation; Dielectric breakdown; Electric breakdown; Linear accelerators; Niobium; Radio frequency; Surface contamination;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-7191-7
  • Type

    conf

  • DOI
    10.1109/PAC.2001.986581
  • Filename
    986581