DocumentCode
377275
Title
Investigation of voltage breakdown caused by microparticles
Author
Werner, G.R. ; Betzwieser, J.C. ; Knobloch, J. ; Padamsee, H. ; Qureshi, M. ; Shipman, J.E. ; McKeown, P.J.
Author_Institution
Lab. of Nucl. Studies, Cornell Univ., Ithaca, NY, USA
Volume
2
fYear
2001
fDate
2001
Firstpage
1071
Abstract
Degradation of RF accelerating cavities caused by field emission currently limits the design of future linear accelerators. When field emission is the problem, foreign particles often deserve the blame, but they can be "processed" away if the cavity electric field is high enough to initiate voltage breakdown near the particle site, in which case the troublesome particle vaporizes, leaving behind a crater surrounded by a starburst-shaped feature. Severe cratering, however, erodes cavity surfaces to the point of significantly diminished acceleration capability. Breakdown events producing craters and starbursts. similar to those seen in RF cavities can also be incited by a DC electric field. After intentionally contaminating niobium and copper cathodes with different kinds of micron-sized particles, we used scanning electron microscopes with EDX and AES capabilities to obtain "before" and "after" pictures of particles that vaporized under DC electric fields between 30 and 150 MV/m
Keywords
accelerator cavities; linear accelerators; niobium; vacuum breakdown; DC electric fields; RF accelerating cavities; cavity electric field; field emission; foreign particles; linear accelerators; micron-sized particles; severe cratering; starburst-shaped feature; voltage breakdown; Acceleration; Cathodes; Copper; Degradation; Dielectric breakdown; Electric breakdown; Linear accelerators; Niobium; Radio frequency; Surface contamination;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Conference_Location
Chicago, IL
Print_ISBN
0-7803-7191-7
Type
conf
DOI
10.1109/PAC.2001.986581
Filename
986581
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