• DocumentCode
    3772976
  • Title

    The relationship of molecular structure to the properties of solid dielectrics

  • Author

    C. R. Vail

  • Author_Institution
    Department of Electrical Engineering Duke University, Durham, N. C.
  • fYear
    1960
  • Firstpage
    156
  • Lastpage
    158
  • Abstract
    For centuries, matter has been understood by man largely in terms of its gross, macroscopic properties. To the electrical engineer this has usually meant such properties as resistivity, permeability, permittivity, and dielectric strength. Engineering design calculations have traditionally been based on tables of experimentally-derived “average” values of such properties. The limitations of the materials described in such tables have, in a major way, delineated the frontiers of engineering achievement to date.
  • Keywords
    "Crystals","Solids","Lattices","Charge carriers","Electric fields","Heating","Metals"
  • Publisher
    ieee
  • Conference_Titel
    Application of Electrical Insulation, 1960 EI National Conference on the
  • Print_ISBN
    978-1-5090-3102-3
  • Type

    conf

  • DOI
    10.1109/ENCAEI.1960.7466630
  • Filename
    7466630