DocumentCode
3772988
Title
The dielectric properties of liquids under a small dc bias
Author
M. P. Strier
Author_Institution
Thomas A. Edison Research Laboratory, McGraw-Edison Company, West Orange, New Jersey, United States
fYear
1962
Firstpage
7
Lastpage
12
Abstract
It is possible to measure capacitances and loss tangents at 100 c.p.s. under dc stresses of at least 4-7 volts/mil and to obtain results equivalent to those for the same material with less initial ionic impurities.
Keywords
"Stress","Liquids","Capacitance","Temperature measurement","Dielectric loss measurement","Loss measurement","Purification"
Publisher
ieee
Conference_Titel
Electrical Insulation, Annual Report 1962 Conference on
Print_ISBN
978-1-5090-3118-4
Type
conf
DOI
10.1109/EIC.1962.7466660
Filename
7466660
Link To Document