• DocumentCode
    3773000
  • Title

    Application of the Eyring Model to capacitor aging data

  • Author

    H. S. Endicott;B. D. Hatch;R. G. Sohmer

  • Author_Institution
    General Electric Company, Philadelphia, Pennsylvania, United States
  • fYear
    1962
  • Firstpage
    47
  • Lastpage
    50
  • Abstract
    It is generally accepted that, for capacitors, the relation between stress and the time at constant temperature is Vnt = constant. Through the Eyring Model for reaction rates, this relation which has been usually considered to be completely empirical is shown to have a theoretical foundation.
  • Keywords
    "Stress","Capacitors","Mathematical model","Aging","Analytical models","Data models","Predictive models"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, Annual Report 1962 Conference on
  • Print_ISBN
    978-1-5090-3118-4
  • Type

    conf

  • DOI
    10.1109/EIC.1962.7466672
  • Filename
    7466672
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3773000