Title :
Application of the Eyring Model to capacitor aging data
Author :
H. S. Endicott;B. D. Hatch;R. G. Sohmer
Author_Institution :
General Electric Company, Philadelphia, Pennsylvania, United States
Abstract :
It is generally accepted that, for capacitors, the relation between stress and the time at constant temperature is Vnt = constant. Through the Eyring Model for reaction rates, this relation which has been usually considered to be completely empirical is shown to have a theoretical foundation.
Keywords :
"Stress","Capacitors","Mathematical model","Aging","Analytical models","Data models","Predictive models"
Conference_Titel :
Electrical Insulation, Annual Report 1962 Conference on
Print_ISBN :
978-1-5090-3118-4
DOI :
10.1109/EIC.1962.7466672
