• DocumentCode
    3773273
  • Title

    Electrical performance of pin-connected stacked backplanes

  • Author

    W. H. Knausenberger

  • Author_Institution
    Bell Laboratories, Whippany, New Jersey
  • fYear
    1973
  • Firstpage
    245
  • Lastpage
    247
  • Abstract
    Multilayer test boards have been fabricated into Stack-Assembled Multiple Multilayer (SAMM) backplane structures. Their crosstalk behavior, signal lead characteristic impedance, and the discontinuities caused by interboard vias have been characterized as a function of the separation between boards.
  • Keywords
    "Backplanes","Crosstalk","Pins","Impedance","Inductance","Nonhomogeneous media","Lead"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation Conference, 1973 EIC 11th
  • Print_ISBN
    978-1-5090-3110-8
  • Type

    conf

  • DOI
    10.1109/EIC.1973.7468700
  • Filename
    7468700