DocumentCode
3774316
Title
Test and Defect Coverage Analytics Model for the assessment of software test adequacy
Author
Nur Hafizah Haron;Sharifah Mashita Syed-Mohamad
Author_Institution
School of Computer Sciences, Universiti Sains Malaysia, 11800 Penang, Malaysia
fYear
2015
Firstpage
13
Lastpage
18
Abstract
Software testing is an essential activity in software development process that has been widely used as a means of achieving software reliability and quality. Software practitioners rely on test coverage to decide whether software under test has achieved an acceptable level of reliability and can be released. The researchers in the field of software testing focus on defining meaningful test coverage as measures which are fre-quently used interchangeably with the notion of test adequacy criteria. Test and defect-based information are among widely used adequacy criteria in the literature. However, little work has been conducted into integrating the two important indicators from the analytics perspective. Therefore, in this paper, Test and Defect Coverage Analytics Model (TDCAM) is proposed. TDCAM provides an analytical view for practitioners to assess and validate the testing results. A case study has been conducted to reveal the practical implications of the proposed model. One of the findings shows that components with low branch coverage percentage tend to have more number of defects detected, in which supports previous work.
Keywords
"Software","Measurement","Data mining","Analytical models","Databases","Software reliability","Testing"
Publisher
ieee
Conference_Titel
Software Engineering Conference (MySEC), 2015 9th Malaysian
Print_ISBN
978-1-4673-8226-7
Type
conf
DOI
10.1109/MySEC.2015.7475188
Filename
7475188
Link To Document