Title :
Technology scaling at an inflection point what´s next?
Author_Institution :
IMEC, USA
Abstract :
Presents a collection of slides covering the following topics: CMOS Scaling; and Advanced CMOS.
Keywords :
"Logic gates","Technology scaling","Silicides","CMOS integrated circuits","FinFETs"
Conference_Titel :
Hot Chips 21 Symposium (HCS), 2009 IEEE
DOI :
10.1109/HOTCHIPS.2009.7478366
