• DocumentCode
    377579
  • Title

    Electron-induced surface chemistry on TiN in ultrahigh vacuum

  • Author

    Ma, Qing ; Rosenberg, Richard A.

  • Author_Institution
    Argonne Nat. Lab., IL, USA
  • Volume
    3
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    2147
  • Abstract
    The property of the TiN/vacuum interface in ultrahigh vacuum and under electron beam irradiation is studied using Auger electron spectroscopy. About one monolayer of oxygen adsorbs on the surface and metal oxidation occurs. The characteristic of oxygen adsorption is discussed. Under electron irradiation with energies ranging from 1 keV to 9 keV, carbon accumulates on the surface, in addition to oxygen adsorption, which modifies the surface chemistry to an extent that depends on the vacuum conditions, electron current density and electron beam energy. High-energy electrons induce TiC formation
  • Keywords
    Auger electron spectra; adsorbed layers; carbon; chemisorbed layers; electron beam effects; electron-surface impact; oxidation; titanium compounds; 1 to 9 keV; Auger electron spectroscopy; C; O; TiC formation; TiN; TiN/vacuum interface; carbon surface accumulation; electron beam energy; electron beam irradiation; electron current density; electron-induced surface chemistry; metal oxidation; oxygen adsorption; ultrahigh vacuum; vacuum condition effects; Chemistry; Electron beams; Energy measurement; Oxidation; Pollution measurement; Spectroscopy; Sputtering; Surface cleaning; Surface contamination; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-7191-7
  • Type

    conf

  • DOI
    10.1109/PAC.2001.987305
  • Filename
    987305