DocumentCode :
3775850
Title :
New solutions for optimal hardware tests of reconfigurable hardware systems
Author :
Asma Ben Ahmed;Olfa Mosbahi;Mohamed Khalgui
Author_Institution :
LISI Laboratory, National Institute of Applied Sciences and Technology, University of Carthage, Carthage, Tunisia
fYear :
2015
Firstpage :
281
Lastpage :
288
Abstract :
This research paper deals with Reconfigurable Hardware Systems (abbreviated, RHS) that should be adapted to their environment under well-defined conditions. A reconfiguration scenario is a run-time hardware operation allowing the addition/removal of hardware components. We classify the reconfiguration scenarios into three levels: Architectural, Structural and Data Reconfiguration Levels. We propose a new solution for optimal hardware tests of RHS based on the definition of new fault collapsing relationships termed Inter-Equivalence, Inter-Dominance and Redundancy.
Keywords :
"Circuit faults","Hardware","Logic gates","Multiplexing","Integrated circuit modeling","Embedded systems","Testing"
Publisher :
ieee
Conference_Titel :
Pervasive and Embedded Computing and Communication Systems (PECCS), 2015 International Conference on
Type :
conf
Filename :
7483774
Link To Document :
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