DocumentCode
3775981
Title
Steerable Riesz wavelet based approach for iris recognition
Author
B. H. Shekar;Sharada S Bhat
Author_Institution
Department of Computer Science, Mangalore University, Mangalore, Karnataka, India
fYear
2015
Firstpage
431
Lastpage
436
Abstract
In this paper, we explore the applicability of first and second order monogenic Steerable Riesz wavelet components for iris recognition. These wavelets provide powerful mechanism to extract the invariant as well as covariant local variations of iris patterns. Unlike other existing methods where sole iris (either left or right) is used for recognition, in our work, we extract the features from both left and right irises, encode them separately and perform bit level fusion. Extensive experimentation has been conducted on the benchmark databases namely, IITD, MMU v-2 and CA-SIA v-4 distance to exhibit the performance of the proposed method. Comparative analysis is also performed with the state of the art methods to justify the suitability of the proposed method for iris recognition.
Keywords
"Iris recognition","Feature extraction","Databases","Encoding","Noise measurement","Wavelet transforms","Radiofrequency integrated circuits"
Publisher
ieee
Conference_Titel
Pattern Recognition (ACPR), 2015 3rd IAPR Asian Conference on
Electronic_ISBN
2327-0985
Type
conf
DOI
10.1109/ACPR.2015.7486540
Filename
7486540
Link To Document