Title :
The new digital-receiver-based system for antiproton beam diagnostics
Author :
Angoletta, M.E. ; Chohan, V. ; Ludwig, M. ; Marqversen, O. ; Pedersen, F.
Author_Institution :
CERN, Geneva, Switzerland
Abstract :
An innovative system to measure antiproton beam intensity, momentum spread and mean momentum in CERN´s Antiproton Decelerator (AD) is described. This system is based on a state-of-the-art digital receiver (DRX) board, consisting of 8 digital down-converter (DDC) chips and one digital signal processor (DSP). An ultra-low-noise, wide-band AC beam transformer (0.2 MHz -30 MHz) is used to measure AC beam current modulation. For bunched beams, the intensity is obtained by measuring the amplitude of the fundamental and second RF Fourier components. On the magnetic plateaus the beam is debunched for stochastic or electron cooling and longitudinal beam properties (intensity, momentum spread and mean momentum) are measured by FFT-based spectral analysis of Schottky signals. The system thus provides real time information characterising the machine performance; it has been used for troubleshooting and to fine-tune the AD, thus achieving further improved performances. This system has been operating since May 2000 and typical results are presented
Keywords :
beam handling techniques; digital signal processing chips; fast Fourier transforms; nuclear electronics; particle beam bunching; particle beam diagnostics; proton accelerators; spectral analysis; stochastic processes; 0.2 to 30 MHz; AC beam current modulation; CERN Antiproton Decelerator; FFT-based spectral analysis; Schottky signals; antiproton beam diagnostics; antiproton beam intensity; bunched beams; digital down-converter chips; digital signal processor; digital-receiver-based system; electron cooling; longitudinal beam properties; magnetic plateaus; mean momentum; momentum spread; stochastic cooling; wide-band AC beam transformer; Cooling; Current measurement; Digital signal processing chips; Digital signal processors; Electron beams; Optical modulation; Radio frequency; Semiconductor device measurement; Stochastic processes; Ultra wideband technology;
Conference_Titel :
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-7191-7
DOI :
10.1109/PAC.2001.987385