DocumentCode :
377768
Title :
Frequency resolved measurement of longitudinal impedances using transient beam diagnostics
Author :
Teytelman, D. ; Fox, J. ; Prabhakar, S. ; Byrd, J.
Author_Institution :
Linear Accel. Center, Stanford Univ., CA, USA
Volume :
1
fYear :
2001
fDate :
2001
Firstpage :
399
Abstract :
In this paper we present several techniques for characterizing longitudinal impedances based on transient measurements of the growth rates and tune shifts of unstable coupled-bunch modes. These techniques are applicable to measurement of both fundamental and higher-order mode impedances and allow characterization of shunt impedances and quality factors of the HOMs. Methods presented are complementary to lab bench measurements of RF cavities, in that the beam based measurements directly sense the physical impedance in the installed configuration. In contrast to a single-bunch integrated impedance measurement these techniques resolve the impedances in the frequency domain. These methods allow determination of the impedance´s unaliased frequency by analyzing synchronous phase transients. Experimental results from ALS and BESSY-II are presented showing the use of these techniques to measure complex impedances
Keywords :
electron accelerators; particle beam bunching; particle beam diagnostics; particle beam stability; ALS; BESSY-II; complex impedances; frequency resolved measurement; growth rates; higher-order mode impedance; longitudinal impedance; quality factor; shunt impedance; transient beam diagnostics; tune shifts; unstable coupled-bunch modes; Current measurement; Eigenvalues and eigenfunctions; Frequency measurement; Impedance measurement; Optical coupling; Particle accelerators; Particle beams; Particle measurements; Radio frequency; Storage rings;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-7191-7
Type :
conf
DOI :
10.1109/PAC.2001.987525
Filename :
987525
Link To Document :
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