DocumentCode
377768
Title
Frequency resolved measurement of longitudinal impedances using transient beam diagnostics
Author
Teytelman, D. ; Fox, J. ; Prabhakar, S. ; Byrd, J.
Author_Institution
Linear Accel. Center, Stanford Univ., CA, USA
Volume
1
fYear
2001
fDate
2001
Firstpage
399
Abstract
In this paper we present several techniques for characterizing longitudinal impedances based on transient measurements of the growth rates and tune shifts of unstable coupled-bunch modes. These techniques are applicable to measurement of both fundamental and higher-order mode impedances and allow characterization of shunt impedances and quality factors of the HOMs. Methods presented are complementary to lab bench measurements of RF cavities, in that the beam based measurements directly sense the physical impedance in the installed configuration. In contrast to a single-bunch integrated impedance measurement these techniques resolve the impedances in the frequency domain. These methods allow determination of the impedance´s unaliased frequency by analyzing synchronous phase transients. Experimental results from ALS and BESSY-II are presented showing the use of these techniques to measure complex impedances
Keywords
electron accelerators; particle beam bunching; particle beam diagnostics; particle beam stability; ALS; BESSY-II; complex impedances; frequency resolved measurement; growth rates; higher-order mode impedance; longitudinal impedance; quality factor; shunt impedance; transient beam diagnostics; tune shifts; unstable coupled-bunch modes; Current measurement; Eigenvalues and eigenfunctions; Frequency measurement; Impedance measurement; Optical coupling; Particle accelerators; Particle beams; Particle measurements; Radio frequency; Storage rings;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Conference_Location
Chicago, IL
Print_ISBN
0-7803-7191-7
Type
conf
DOI
10.1109/PAC.2001.987525
Filename
987525
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