DocumentCode :
3777785
Title :
Fault-tolerant high performance scheme design
Author :
A. Matrosova;S. Ostanin;I. Kirienko;E. Nikolaeva
Author_Institution :
Department of Applied Mathematics and Cybernetics, Tomsk State University, Tomsk, Russia
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
Extending a set of faults on account of path delay ones (PDFs) for the fault-tolerant scheme previously oriented to transient or intermittent single stuck-at faults at gate poles of a synchronous sequential circuit is suggested. PDFs are also either transient or intermittent faults. The scheme is based on replicating a self-checking synchronous sequential circuit and using a checker for one of the circuit. We don´t need to provide a self-testing property for the checker. It is supposed that each next fault appears when a previous one has disappeared. Estimations of the scheme complexity, and its modification oriented to masking only PDFs are discussed.
Keywords :
"Circuit faults","Delays","Logic gates","Sequential circuits","Fault tolerance","Fault tolerant systems","Transient analysis"
Publisher :
ieee
Conference_Titel :
East-West Design & Test Symposium (EWDTS), 2015 IEEE
Type :
conf
DOI :
10.1109/EWDTS.2015.7493129
Filename :
7493129
Link To Document :
بازگشت