DocumentCode :
3777809
Title :
Quality improvement of analog circuits fault diagnosis based on ANN using clusterization as preprocessing
Author :
Sergey Mosin
Author_Institution :
Computer engineering department, Vladimir State University (VSU) Vladimir, Russia
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
The technique of improvement the fault diagnosis quality of analog circuits using artificial neural network is proposed. The technique is based on combining the methods of clustering and classification the output circuits responses taking into consideration component tolerances at data preparation and training the ANN for solving task of fault diagnosis. The decomposition of technique with description of each step is presented. The results of experimental investigation demonstrating high quality of ANN training for effective fault diagnosis of analog circuits with low probability of ?- and ?-errors are considered.
Keywords :
"Circuit faults","Artificial neural networks","Training","Fault diagnosis","Neurons","Analog circuits"
Publisher :
ieee
Conference_Titel :
East-West Design & Test Symposium (EWDTS), 2015 IEEE
Type :
conf
DOI :
10.1109/EWDTS.2015.7493158
Filename :
7493158
Link To Document :
بازگشت