Optimized sample method of weapon testability based on GSPN & AHP

Currently, testability is regarded more and more important by manufactories during weapon is designed and has become vital characteristics of weapon availability. It is important test item of approval test and important component of weapon efficiency. In this paper, According to the demand of testability test during approval test, certain weapon testability requirement model is constructed based on generalized stochastic Petri nets (GSPN), testability indexed importance is computed based on testability indexes value; This weapon analytic hierarchy graph is constructed based on analytic hierarchy process (AHP), through analysing and reasoning three hierarchy structure, the weight coefficient about sample distribution and selection principle based on GSPN & AHP were established.