Title :
Research and implementation of boundary scan test system based on EDIF
Author :
Chen Shouhong; Hou Xingna; Wang Zhuang; Yan Xuelong; Xu Chuanpei
Author_Institution :
Guilin University of Electronic Technology, Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, Jingji Road No.1, China, 541004
fDate :
7/1/2015 12:00:00 AM
Abstract :
Boundary scan test technology with its unique ?virtual probe? characteristic provides a powerful means to solve the difficult problem of high density integrated test system components. It introduces the development of a more general boundary scan test system based on EDIF (Electronic Design Interchange Format). The hardware of the system is based on USB bus, including the PC, USB driver interface, the boundary scan test bus controller, test access port JTAG bus; software is based on XP system, through the Visual Studio 2008 as the programming environment, using SQLite3 database manages test module data. The test system can achieve the test and fault diagnosis. Finally the future development trend of boundary scan test technology is analyzed.
Keywords :
"Standards","Hardware","Software","Testing","Fault diagnosis","Maintenance engineering","Circuit faults"
Conference_Titel :
Electronic Measurement & Instruments (ICEMI), 2015 12th IEEE International Conference on
DOI :
10.1109/ICEMI.2015.7494256