DocumentCode
3778063
Title
Research on calibration for automatic test system based on scattering parameters of cascaded microwave networks
Author
Guo Min; Zhao Xiucai; Wang Zunfeng; Guan Bin
Author_Institution
Science and Technology on Electronic Test &
Volume
2
fYear
2015
fDate
7/1/2015 12:00:00 AM
Firstpage
579
Lastpage
583
Abstract
In the practical application of microwave automatic test system, due to the complexity of test channels and unconventional requirements, the system in general in the automatic test method of On Station Calibration makes that system configuration of the general instruments and equipment cannot achieve effective correction of error test system by ideal calibration, thus resulting in a decline in the test accuracy of the system and even measure failure[1–2]. To solve this problem, this paper presents a method calibration for automatic test system based on scattering parameters of cascaded microwave networks, It can ensure test accuracy without distortion in different test conditions, satisfy the high performance, high accuracy, multi-parameter, multi-function automatic test requirements in the form of generalization.
Keywords
"Scattering parameters","Microwave FET integrated circuits","Microwave integrated circuits","Calibration","Microwave theory and techniques","Instruments","Microwave measurement"
Publisher
ieee
Conference_Titel
Electronic Measurement & Instruments (ICEMI), 2015 12th IEEE International Conference on
Type
conf
DOI
10.1109/ICEMI.2015.7494287
Filename
7494287
Link To Document