• DocumentCode
    3778063
  • Title

    Research on calibration for automatic test system based on scattering parameters of cascaded microwave networks

  • Author

    Guo Min; Zhao Xiucai; Wang Zunfeng; Guan Bin

  • Author_Institution
    Science and Technology on Electronic Test &
  • Volume
    2
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    579
  • Lastpage
    583
  • Abstract
    In the practical application of microwave automatic test system, due to the complexity of test channels and unconventional requirements, the system in general in the automatic test method of On Station Calibration makes that system configuration of the general instruments and equipment cannot achieve effective correction of error test system by ideal calibration, thus resulting in a decline in the test accuracy of the system and even measure failure[1–2]. To solve this problem, this paper presents a method calibration for automatic test system based on scattering parameters of cascaded microwave networks, It can ensure test accuracy without distortion in different test conditions, satisfy the high performance, high accuracy, multi-parameter, multi-function automatic test requirements in the form of generalization.
  • Keywords
    "Scattering parameters","Microwave FET integrated circuits","Microwave integrated circuits","Calibration","Microwave theory and techniques","Instruments","Microwave measurement"
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments (ICEMI), 2015 12th IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/ICEMI.2015.7494287
  • Filename
    7494287