A semi-automated real-time gamma radiation response measurement system for semiconductor device characterisation

This paper describes a semi-automated measurement system for the electrical characterization of the real-time radiation response of electronic devices in the form of semiconductor chips or wafer pieces under gamma irradiation. In-situ I–V and C-V measurements can be performed while the devices are continuously subject to gamma radiation. The system requires no advanced equipment but standard measurement instruments and apparatus. The testing system is feasible for laboratory-scale implementation while keeping the radiation risk of the human operator to a minimum. Measurement results of MOS capacitors are reported using such a system.