Title :
A high precision CCD device quantum efficiency calibration device and the evaluation of uncertainty measurement
Author :
Hongyuan Liu;Hengfei Wang;Hongchao Wang;Chengping Ying; Shi Xueshun; Wu Bin; Huo Mingming
Author_Institution :
The 41st Research Institute of CETC Qingdao, 266555, China
fDate :
7/1/2015 12:00:00 AM
Abstract :
Quantum efficiency is one of the most important parameters of CCD, according to the high precision of current CCD device quantum efficiency calibration requirements, provides a high accuracy CCD device quantum efficiency measurement method. The incident light source of the method using 632.8nm laser as the integral ball, produce monochromatic large area uniform light, as in the 632.8nm wavelength point standard detector is directly traceable to a cryogenic radiometer,through this design to reduce intermediate links, greatly improve the system measurement uncertainty, achieved the CCD device quantum efficiency is directly traceable to cryogenic radiometer, and expanded uncertainty of the system is evaluated and analyzed, the system is obtained by the expanded uncertainty was 1.5%. Finally, the choice of two CCD devices for the measurement uncertainty of the system is verified,it shows that the system can meet the calibration of high precision CCD device quantum efficiency, can provide more accurate data for the use of the CCD device manufacturers and users.
Keywords :
"Charge coupled devices","Detectors","Measurement uncertainty","Time measurement","Standards","Wavelength measurement","Surface waves"
Conference_Titel :
Electronic Measurement & Instruments (ICEMI), 2015 12th IEEE International Conference on
DOI :
10.1109/ICEMI.2015.7494419