DocumentCode
3778468
Title
System based on low coherence interferometry for long distance measurement
Author
Eneas N. Morel;Jorge R. Torga;N?lida A. Russo;Ricardo Duchowicz
Author_Institution
Laboratorio de Optoelectr?nica y Metrolog?a Aplicada, Facultad Regional Delta, UTN, Campana, Buenos Aires, Argentina
fYear
2015
Firstpage
1
Lastpage
6
Abstract
In this work, the use of optical tomography technique (OCT) for measuring long distances (larger than 5 cm) is presented. The scheme employs as light source, a tunable fiber laser with emission in the spectral region near 1550 nm and a self-calibration system. Although the advance of OCT technique in its different formats (flight time or time domain, Fourier domain or the latest known as white light) has an intense development, it is more oriented to measurements with high resolution, but where the sample size does not exceed 4 mm. Then, the proposed system extends the range of industrial applications.
Keywords
"Fabry-Perot","Three-dimensional displays","Silicon","Decision support systems","Silicon compounds","Robustness"
Publisher
ieee
Conference_Titel
Information Processing and Control (RPIC), 2015 XVI Workshop on
Type
conf
DOI
10.1109/RPIC.2015.7497140
Filename
7497140
Link To Document