• DocumentCode
    3778468
  • Title

    System based on low coherence interferometry for long distance measurement

  • Author

    Eneas N. Morel;Jorge R. Torga;N?lida A. Russo;Ricardo Duchowicz

  • Author_Institution
    Laboratorio de Optoelectr?nica y Metrolog?a Aplicada, Facultad Regional Delta, UTN, Campana, Buenos Aires, Argentina
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this work, the use of optical tomography technique (OCT) for measuring long distances (larger than 5 cm) is presented. The scheme employs as light source, a tunable fiber laser with emission in the spectral region near 1550 nm and a self-calibration system. Although the advance of OCT technique in its different formats (flight time or time domain, Fourier domain or the latest known as white light) has an intense development, it is more oriented to measurements with high resolution, but where the sample size does not exceed 4 mm. Then, the proposed system extends the range of industrial applications.
  • Keywords
    "Fabry-Perot","Three-dimensional displays","Silicon","Decision support systems","Silicon compounds","Robustness"
  • Publisher
    ieee
  • Conference_Titel
    Information Processing and Control (RPIC), 2015 XVI Workshop on
  • Type

    conf

  • DOI
    10.1109/RPIC.2015.7497140
  • Filename
    7497140