Title :
Mathematical model of point events in CCD images
Author :
Guillermo Fernandez Moroni;Miguel Sofo Haro;Javier Tiffenberg;Gustavo Cancelo;Eduardo E. Paolini;Juan Estrada;Xavier Bertou
Author_Institution :
Instituto de Inv. Ing. El?ctrica (IIIE), CONICET-Universidad del Sur, Bah?a Blanca, Argentina
Abstract :
In this article a stochastic model for point events expected in the output image of scientific CCDs is derived. This kind of events are typical in CCD systems dedicated to particle detection, such as DAMIC and CONNIE. The model includes the randomness of the charge movement in the silicon and the noise at the readout stage providing the base for an optimal detection technique.
Keywords :
"Mathematical model","Charge coupled devices","Silicon","Photonics","Correlation","Neutrino sources","Substrates"
Conference_Titel :
Information Processing and Control (RPIC), 2015 XVI Workshop on
DOI :
10.1109/RPIC.2015.7497157
