Title :
Chirped-beam two-stage SASE-FEL for high power femtosecond X-ray pulse generation
Author :
Schroeder, C.B. ; Pellegrini, C. ; Reiche, S. ; Arthur, J. ; Emma, P.
Author_Institution :
SLAC, Stanford, CA, USA
Abstract :
We present a method for generating femtosecond duration X-ray pulses using a single-pass free-electron laser (FEL). This method uses an energy-chirped electron beam to produce a frequency-chirped X-ray pulse through self-amplified spontaneous emission (SASE). After the undulator we consider passing the radiation through a monochromator. The frequency is correlated to the longitudinal position within the pulse, and therefore, by selecting a narrow bandwidth, a short temporal pulse will be transmitted. The short pulse radiation is used to seed a second undulator, where the radiation is amplified to saturation. In addition to short pulse generation, this scheme has the ability to control shot-to-shot fluctuations in the central wavelength due to electron beam energy jitter. We present calculations of the radiation characteristics produced by a chirped-beam two-stage SASE-FEL, and consider the performance of the chirped-beam two-stage option for the Linac Coherent Light Source (LCLS)
Keywords :
X-ray monochromators; X-ray production; beam handling equipment; collective accelerators; fluctuations; free electron lasers; high-speed optical techniques; jitter; linear accelerators; particle beam diagnostics; spontaneous emission; LCLS; Linac Coherent Light Source; chirped-beam two-stage SASE-FEL; electron beam energy jitter; high power femtosecond X-ray pulse generation; longitudinal position; monochromator; self-amplified spontaneous emission; shot-to-shot fluctuations; single-pass free-electron laser; Bandwidth; Chirp; Electron beams; Free electron lasers; Frequency; Optical pulse generation; Pulse amplifiers; Spontaneous emission; Undulators; X-ray lasers;
Conference_Titel :
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-7191-7
DOI :
10.1109/PAC.2001.987897