• DocumentCode
    3779900
  • Title

    Investigation of Transmission line modelling method for dielectric characterization using ring resonator

  • Author

    Anagha Kunte;Arun Gaikwad;Savita Kulkarni

  • Author_Institution
    Sinhgad college of Engineering, Pune, India
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    This paper presents Transmission line modeling (TLM) method that can be used for characterization of dielectric material in the time domain using planar microstrip ring resonator sensor. 3D model of the ring resonator is developed using hexahedral nodes, to determine the dielectric constant. Analysis of TLM method is done for different dielectric materials. In this study; all measurements are done at 2.45 GHz. The results obtained with the TLM method are compared with practical as well as standard values. It is shown that the error in measurements with the time domain method is lesser when compared with the frequency domain method.
  • Keywords
    "Time-domain analysis","Time-varying systems","Permittivity","Optical ring resonators","Transmission line measurements","Frequency-domain analysis","Resonant frequency"
  • Publisher
    ieee
  • Conference_Titel
    Applied Electromagnetics Conference (AEMC), 2015 IEEE
  • Type

    conf

  • DOI
    10.1109/AEMC.2015.7509157
  • Filename
    7509157