DocumentCode
3779900
Title
Investigation of Transmission line modelling method for dielectric characterization using ring resonator
Author
Anagha Kunte;Arun Gaikwad;Savita Kulkarni
Author_Institution
Sinhgad college of Engineering, Pune, India
fYear
2015
Firstpage
1
Lastpage
2
Abstract
This paper presents Transmission line modeling (TLM) method that can be used for characterization of dielectric material in the time domain using planar microstrip ring resonator sensor. 3D model of the ring resonator is developed using hexahedral nodes, to determine the dielectric constant. Analysis of TLM method is done for different dielectric materials. In this study; all measurements are done at 2.45 GHz. The results obtained with the TLM method are compared with practical as well as standard values. It is shown that the error in measurements with the time domain method is lesser when compared with the frequency domain method.
Keywords
"Time-domain analysis","Time-varying systems","Permittivity","Optical ring resonators","Transmission line measurements","Frequency-domain analysis","Resonant frequency"
Publisher
ieee
Conference_Titel
Applied Electromagnetics Conference (AEMC), 2015 IEEE
Type
conf
DOI
10.1109/AEMC.2015.7509157
Filename
7509157
Link To Document