• DocumentCode
    3779920
  • Title

    Effects of coaxial probe dimensions on broadband transition to substrate integrate waveguide

  • Author

    Chandra Shekhar Prasad;Animesh Bishwas

  • Author_Institution
    Department of Electrical engineering, Indian Institute of Technology, Kanpur, India
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The effect of probe dimensions on the excitation of substrate integrated waveguide (SIW) in thick substrate in X (8- 12 GHz) and Ku (12-18 GHz)-frequency band is presented. The SIW is excited by a standard SMA connector and with K-connector and their performances are compared. The proposed transition is simulated using Ansof HFSS. The simulated bandwidth (S11<; -20dB) for standard SMA-to-SIW back-to-back transition is 38.65% and for the K-connector-to-SIW back-to-back transition it is improved up to 61.81%.
  • Keywords
    "Substrates","Connectors","Probes","Standards","Waveguide transitions","Bandwidth","Dielectrics"
  • Publisher
    ieee
  • Conference_Titel
    Applied Electromagnetics Conference (AEMC), 2015 IEEE
  • Type

    conf

  • DOI
    10.1109/AEMC.2015.7509177
  • Filename
    7509177