DocumentCode
3779920
Title
Effects of coaxial probe dimensions on broadband transition to substrate integrate waveguide
Author
Chandra Shekhar Prasad;Animesh Bishwas
Author_Institution
Department of Electrical engineering, Indian Institute of Technology, Kanpur, India
fYear
2015
Firstpage
1
Lastpage
2
Abstract
The effect of probe dimensions on the excitation of substrate integrated waveguide (SIW) in thick substrate in X (8- 12 GHz) and Ku (12-18 GHz)-frequency band is presented. The SIW is excited by a standard SMA connector and with K-connector and their performances are compared. The proposed transition is simulated using Ansof HFSS. The simulated bandwidth (S11<; -20dB) for standard SMA-to-SIW back-to-back transition is 38.65% and for the K-connector-to-SIW back-to-back transition it is improved up to 61.81%.
Keywords
"Substrates","Connectors","Probes","Standards","Waveguide transitions","Bandwidth","Dielectrics"
Publisher
ieee
Conference_Titel
Applied Electromagnetics Conference (AEMC), 2015 IEEE
Type
conf
DOI
10.1109/AEMC.2015.7509177
Filename
7509177
Link To Document