Holographic recording of surface relief gratings on As40S60−xSex thin films

The studies of direct holographic recording of the surface relief gratings on amorphous As₄₀S_60-xSe_x thin films are presented. These gratings were created upon exposure to polarized laser beams of various wavelengths (λ = 473 - 650 nm). The orthogonally ±45° linearly polarized light beams were used for recording. The surface structure of the relief gratings was investigated by atomic force microscopy. The influence of laser beam wavelength and spatial frequency of the gratings recorded (grating period ?) on the surface relief gratings formation for every composition was examined.