DocumentCode :
3780885
Title :
A method for evaluation of edge capacitance of a two-layer dielectric capacitor, with materials of widely different and variable dielectric constants
Author :
B. P. Kang;George Balakian
Author_Institution :
Rutgers University, New Brunswick, N. J
fYear :
1950
Firstpage :
59
Lastpage :
63
Abstract :
In a recent study on the change of dielectric constant as a determination of the progress of crystallization of an inorganic compound, a great deal of difficulty had been experienced. The cause lay in the high and continually changing dielectric constant of the specimen and in the necessity of involving the use of a series capacitor and a container both of which had different dielectric constants from each other and from the specimen.
Keywords :
"Dielectric constant","Capacitors","Containers","Capacitance","Electrodes","Crystallization"
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 1950 Conference On
Print_ISBN :
978-1-5090-3127-6
Type :
conf
DOI :
10.1109/CEI.1950.7513608
Filename :
7513608
Link To Document :
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