DocumentCode :
3780900
Title :
Microwave measurements of dielectrics in free space
Author :
D. J. Epstein
Author_Institution :
Laboratory for Insulation Research, Massachusetts Institute of Technology, Cambridge 39, Mass.
fYear :
1950
Firstpage :
97
Lastpage :
97
Abstract :
The measurement of dielectric properties in the microwave band is usually accomplished by placing the sample in a waveguide or resonant cavity. Free-space methods, while lacking the general versatility of waveguide techniques, exhibit certain advantageous features: the problem of maintaining a precision fit between the sample and the guide is avoided; certain structures, for example, “honeycomb” materials and artificial dielectrics, can not be measured by waveguide methods but can be measured in free space; and at millimeter wavelengths, waveguide procedures become more complicated while free space techniques retain their simplicity.
Keywords :
"Dielectric measurement","Dielectrics","Optical waveguides","Mirrors","Reflection","Extraterrestrial measurements","Microwave measurement"
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 1950 Conference On
Print_ISBN :
978-1-5090-3127-6
Type :
conf
DOI :
10.1109/CEI.1950.7513623
Filename :
7513623
Link To Document :
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