DocumentCode
3780900
Title
Microwave measurements of dielectrics in free space
Author
D. J. Epstein
Author_Institution
Laboratory for Insulation Research, Massachusetts Institute of Technology, Cambridge 39, Mass.
fYear
1950
Firstpage
97
Lastpage
97
Abstract
The measurement of dielectric properties in the microwave band is usually accomplished by placing the sample in a waveguide or resonant cavity. Free-space methods, while lacking the general versatility of waveguide techniques, exhibit certain advantageous features: the problem of maintaining a precision fit between the sample and the guide is avoided; certain structures, for example, “honeycomb” materials and artificial dielectrics, can not be measured by waveguide methods but can be measured in free space; and at millimeter wavelengths, waveguide procedures become more complicated while free space techniques retain their simplicity.
Keywords
"Dielectric measurement","Dielectrics","Optical waveguides","Mirrors","Reflection","Extraterrestrial measurements","Microwave measurement"
Publisher
ieee
Conference_Titel
Electrical Insulation, 1950 Conference On
Print_ISBN
978-1-5090-3127-6
Type
conf
DOI
10.1109/CEI.1950.7513623
Filename
7513623
Link To Document