• DocumentCode
    3780900
  • Title

    Microwave measurements of dielectrics in free space

  • Author

    D. J. Epstein

  • Author_Institution
    Laboratory for Insulation Research, Massachusetts Institute of Technology, Cambridge 39, Mass.
  • fYear
    1950
  • Firstpage
    97
  • Lastpage
    97
  • Abstract
    The measurement of dielectric properties in the microwave band is usually accomplished by placing the sample in a waveguide or resonant cavity. Free-space methods, while lacking the general versatility of waveguide techniques, exhibit certain advantageous features: the problem of maintaining a precision fit between the sample and the guide is avoided; certain structures, for example, “honeycomb” materials and artificial dielectrics, can not be measured by waveguide methods but can be measured in free space; and at millimeter wavelengths, waveguide procedures become more complicated while free space techniques retain their simplicity.
  • Keywords
    "Dielectric measurement","Dielectrics","Optical waveguides","Mirrors","Reflection","Extraterrestrial measurements","Microwave measurement"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1950 Conference On
  • Print_ISBN
    978-1-5090-3127-6
  • Type

    conf

  • DOI
    10.1109/CEI.1950.7513623
  • Filename
    7513623