• DocumentCode
    3780944
  • Title

    Design rule driven behavioral synthesis for test

  • Author

    S.N. Hamilton;T. Gonzalez;A. Orailoglu

  • Author_Institution
    Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
  • Volume
    2
  • fYear
    1998
  • Firstpage
    1033
  • Abstract
    We have developed a new approach to behavioral synthesis for testability. Utilizing a VHDL transformation environment, we have distilled design rules for testable VHDL generation. Design rules can be linked to specific design for test techniques, allowing simplified exploration of BIST, partial scan, and other test approaches. The result is a design methodology which is simple to use, improves testability, and decreases time to market.
  • Keywords
    "Automatic testing","Built-in self-test","High level synthesis","Time to market","Hardware","Space exploration","Sequential analysis","Computer science","Production","Costs"
  • Publisher
    ieee
  • Conference_Titel
    Signals, Systems & Computers, 1998. Conference Record of the Thirty-Second Asilomar Conference on
  • ISSN
    1058-6393
  • Print_ISBN
    0-7803-5148-7
  • Type

    conf

  • DOI
    10.1109/ACSSC.1998.751419
  • Filename
    751419