DocumentCode
3780944
Title
Design rule driven behavioral synthesis for test
Author
S.N. Hamilton;T. Gonzalez;A. Orailoglu
Author_Institution
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
Volume
2
fYear
1998
Firstpage
1033
Abstract
We have developed a new approach to behavioral synthesis for testability. Utilizing a VHDL transformation environment, we have distilled design rules for testable VHDL generation. Design rules can be linked to specific design for test techniques, allowing simplified exploration of BIST, partial scan, and other test approaches. The result is a design methodology which is simple to use, improves testability, and decreases time to market.
Keywords
"Automatic testing","Built-in self-test","High level synthesis","Time to market","Hardware","Space exploration","Sequential analysis","Computer science","Production","Costs"
Publisher
ieee
Conference_Titel
Signals, Systems & Computers, 1998. Conference Record of the Thirty-Second Asilomar Conference on
ISSN
1058-6393
Print_ISBN
0-7803-5148-7
Type
conf
DOI
10.1109/ACSSC.1998.751419
Filename
751419
Link To Document