DocumentCode :
3781337
Title :
Design and testing of CMOS compatible EEPROM
Author :
Haibin Yin;Xiaohong Peng;Peiyuan Wan;Jinhui Wang;Ligang Hou
Author_Institution :
VLSI and System Lab, Beijing University of Technology, Beijing 100124, China
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
A single-poly CMOS compatible Electrically Erasable Programmable Read-Only Memory (EEPROM) is presented in this paper. The difference between the traditional structure and the proposed structure is that the capacitance between control gate and floating gate, and the capacitance between floating gate and channel are fabricated on the same layer. This approach makes EEPROM and periphery circuits can be fabricated in the standard CMOS technology, so development cost is greatly reduced. An 8 byte × 8 bits EEPROM array including readout circuit and charge pump circuit is implemented in TSMC 0.35μm CMOS technology in this paper. Meanwhile, pre-charge scheme is used in the readout circuit.
Keywords :
"Tunneling","Nonvolatile memory","EPROM","Logic gates","CMOS integrated circuits","CMOS technology","Capacitance"
Publisher :
ieee
Conference_Titel :
ASIC (ASICON), 2015 IEEE 11th International Conference on
Print_ISBN :
978-1-4799-8483-1
Electronic_ISBN :
2162-755X
Type :
conf
DOI :
10.1109/ASICON.2015.7517140
Filename :
7517140
Link To Document :
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