• DocumentCode
    3781337
  • Title

    Design and testing of CMOS compatible EEPROM

  • Author

    Haibin Yin;Xiaohong Peng;Peiyuan Wan;Jinhui Wang;Ligang Hou

  • Author_Institution
    VLSI and System Lab, Beijing University of Technology, Beijing 100124, China
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A single-poly CMOS compatible Electrically Erasable Programmable Read-Only Memory (EEPROM) is presented in this paper. The difference between the traditional structure and the proposed structure is that the capacitance between control gate and floating gate, and the capacitance between floating gate and channel are fabricated on the same layer. This approach makes EEPROM and periphery circuits can be fabricated in the standard CMOS technology, so development cost is greatly reduced. An 8 byte × 8 bits EEPROM array including readout circuit and charge pump circuit is implemented in TSMC 0.35μm CMOS technology in this paper. Meanwhile, pre-charge scheme is used in the readout circuit.
  • Keywords
    "Tunneling","Nonvolatile memory","EPROM","Logic gates","CMOS integrated circuits","CMOS technology","Capacitance"
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2015 IEEE 11th International Conference on
  • Print_ISBN
    978-1-4799-8483-1
  • Electronic_ISBN
    2162-755X
  • Type

    conf

  • DOI
    10.1109/ASICON.2015.7517140
  • Filename
    7517140